The Research on he Optimized Non-Contact Electric-Field Measurement Method of Electric-Field for Detecting Insulators

摘要

The paper adopts genetic arithmetic (GA) to optimize non-contact electric-field measurement method ((NCEFMM) of electric-field for detecting high-voltage insulators and improve the defect of low calculation accuracy of simulation charge method (SCM) in solve electrostatic field. In the method, GA is used to optimize the quantity of simulation charges. The paper identifies the accuracy of simulation charge by the differences of measurement point potential between calculated value and actual value. It improves the accuracy by using optimizing simulation charge to calculate the electric-field of insulators, and it is feasible to increase the accuracy of electric-field method to detect defective insulators.