首页> 外文会议>IEEE International Test Conference 2010 >Concurrent test supported by DFT techniques and ATE companies
【24h】

Concurrent test supported by DFT techniques and ATE companies

机译:DFT技术和ATE公司支持的并行测试

获取原文

摘要

Concurrent Test needs support by DFT and ATE. A lot of devices are suitable for concurrent test, but what about ATE hardware and software? Do they support concurrent test adequately? What are the different philosophies in DFT and ATE hardware and software?
机译:并发测试需要DFT和ATE的支持。许多设备都适合进行并发测试,但是ATE硬件和软件又如何呢?他们是否充分支持并发测试? DFT和ATE硬件和软件的不同哲学是什么?

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号