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Impact of bias current and geometry on noise performance of SiGe HBT low noise amplifier

机译:偏置电流和几何形状对SiGe HBT低噪声放大器的噪声性能的影响

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摘要

The noise figure of SiGe HBT for low noise amplification is analyzed and its intrinsic minimum noise figure is expressed analytically. Four types of SiGe HBTs with different transistor geometry of emitter stripe width, emitter stripe length and base stripe number were fabricated using a state-of-art SiGe HBT technology. The considerations involved in the judicious choice of biased current and transistor geometry are explored through theory data and measuring results. A conclusion is drawn that an optimum noise figure can be achieved by proper choice of biased current and transistor geometry with longer emitter length and more base stripe number.
机译:分析了用于低噪声放大的SiGe HBT的噪声系数,并通过解析表示了其固有的最小噪声系数。使用最新的SiGe HBT技术制造了四种具有不同晶体管几何形状的SiGe HBT,它们的发射极条纹宽度,发射极条纹长度和基极条纹数量不同。通过理论数据和测量结果探讨了明智选择偏置电流和晶体管几何形状所涉及的考虑因素。甲得出结论的是最佳的噪声系数可以通过用较长的发射极长度和多个碱基条纹数目偏置电流和晶体管的几何形状适当选择来实现。

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