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Design of Experiment Optimization of Erbium-Doped Fiber to Single Mode Fiber Splices

机译:掺Er光纤到单模光纤接头的实验优化设计

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Optimizing splicing of Erbium Doped Fiber (EDF) to Single Mode Fiber (SMF) is a critical requirement to maximize the efficiency of Erbium Doped Fiber Amplifiers (EDFAs). This paper describes the key parameters which affect the splice loss of EDF-SMF splices as well as the optimization process used to achieve 50% splice loss improvement. Before performing the optimization process, the measurement system was validated with an evaluation including: laser stability, detector linearity and Gage R&R (Repeatability & Reproducibility). The optimization of EDF and SMF splicing was performed using a design of experiment with 2~k factorial design and using MiniTab software for data analysis. A commercially available fusion splicer was used. There were 53 parameters available for setting, They were selected and divided into two groups. The first group included the parameters which might affect the splice loss and the second group included the parameters which might affect the estimated splice loss. The optimization process for the first group of parameters was performed until the target loss was met. The Arcl Power and Arcl Time were identified as the most critical parameters for loss. Then the optimization process for the second group of parameters was performed until the slope of the graph of estimated splice loss to actual splice loss was nearly one. This method reduced the average actual splice loss from factory setting of EDF-SMF splicing (0.18 dB) to 0.10 dB and SMF-EDF splicing to 0.09dB. The difference between estimated loss and actual loss was less than 0.05dB for either direction (measurements in the EDF-SMF and SMF-EDF direction). The proposed design of experiment can be used as a reference process to perform the optimization of EDF to SMF splicing when Erbium Doped Fiber is changed to the other fiber types.
机译:优化掺Do光纤(EDF)到单模光纤(SMF)的拼接是最大化掺Do光纤放大器(EDFA)效率的关键要求。本文介绍了影响EDF-SMF接头熔接损耗的关键参数,以及用于实现50%熔接损耗改善的优化过程。在执行优化过程之前,对测量系统进行了评估,评估包括:激光稳定性,探测器线性度和量具R&R(重复性和再现性)。 EDF和SMF拼接的优化是通过使用2〜k因子设计的实验设计以及使用MiniTab软件进行数据分析来进行的。使用可商购的熔接机。有53个可用于设置的参数,它们被选择并分为两组。第一组包括可能影响熔接损耗的参数,第二组包括可能影响估计熔接损耗的参数。对第一组参数执行优化过程,直到达到目标损耗为止。 Arcl Power和Arcl Time被确定为损耗的最关键参数。然后执行第二组参数的优化过程,直到估计的熔接损耗与实际熔接损耗的曲线图的斜率接近1。此方法将出厂设置的EDF-SMF拼接(0.18 dB)的平均实际拼接损耗降低到0.10 dB,将SMF-EDF拼接的平均实际拼接损耗降低到0.09dB。任一方向(在EDF-SMF和SMF-EDF方向上的测量)的估计损耗与实际损耗之间的差异均小于0.05dB。当掺design光纤改为其他光纤类型时,建议的实验设计可作为参考过程,以进行EDF对SMF熔接的优化。

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