TIME-DEPENDENT STRAIN RESPONSES OF A POLED PZT WAFER UNDER VARIOUS CONSTANT MAGNITUDES OF LONGITUDINAL TENSILE STRESS

摘要

A commercially available soft lead titanate zirconate (PZT) wafer that is poled in thickness direction is subjected to various constant magnitudes of longitudinal tensile stress. The evolutions of longitudinal and transverse in-plane strains over time are measured in short- and open-circuit boundary conditions. The measurements are explained qualitatively in terms of domain switching and predicted quantitatively by a free energy model of normal distribution.