不揮発性体積型液晶ホログラムメモリを用いた光再構成型ゲートアレイの故障耐性

摘要

An optically reconfigurable gate array (ORGA) consists of a gate array VLSI, a holographic memory, and a laser array.The ORGA can achieve rapid reconfiguration by exploiting optical connections. Moreover, such parallel connectionsallow to realize high defect tolerance. This paper presents the defect tolerance of an optically reconfigurable gate arrayusing a non-volatile volume holographic memory.