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A design methodology for efficiency improvement of CMOS class-E power amplifiers

机译:一种提高CMOS E类功率放大器效率的设计方法

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This paper presents an analysis on efficiency improvement of class-E power amplifiers (PAs) with Microelectromechanical systems (MEMS) inductors. The efficiency can be improved and has been demonstrated by using MEMS inductors. The proposed MEMS technology is validated by a prototype MEMS inductor. Also, the simulation result of MEMS inductors by HFSS have good match with the measured result. The stacked-metal layer inductors implemented in MEMS process are developed for increasing the quality factor. The simulation result of a CMOS class-E PA with MEMS inductors shows that the increased quality factor of inductors by 2 can improve the drain efficiency by 6%. Therefore, we present a design methodology that can improve the efficiency of PAs by optimizing the quality factor of fully integrated inductors.
机译:本文介绍了使用微机电系统(MEMS)电感器提高E类功率放大器(PA)效率的分析。效率可以提高,并且已经通过使用MEMS电感器得到了证明。 MEMS电感器原型验证了所提出的MEMS技术。此外,HFSS对MEMS电感器的仿真结果与测量结果具有很好的匹配性。为了提高品质因数,开发了以MEMS工艺实现的叠层金属层电感器。带有MEMS电感器的CMOS E类PA的仿真结果表明,将电感器的品质因数提高2可以使漏极效率提高6%。因此,我们提出了一种设计方法,可以通过优化完全集成电感器的品质因数来提高功率放大器的效率。

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