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Measurements of acoustic properties of ZnO single crystals by the LFB/PW ultrasonic material characterization system

机译:LFB / PW超声材料表征系统测量ZnO单晶的声学特性

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We evaluated the resistivities of a Z-cut ZnO single crystal plate specimen by measuring longitudinal-wave propagation characteristics (velocity and attenuation) in frequencies from 50 MHz to 1.5 GHz and also leaky surface acoustic wave (LSAW) velocities (VLSAW) on the specimen surfaces at 225 MHz using a line-focus-beam/plane-wave (LFB/PW) ultrasonic material characterization (UMC) system. A slight decrease of VLSAW was observed on -Z-plane of the specimen initially prepared in comparison with VLSAW on the +Z surface. The corresponding Z-axis longitudinal-wave propagation characteristics exhibited significant velocity dispersion and frequency dependence of attenuation associated with relatively low resistivity. For the specimen by removing the -Z side surface by about 0.5-mm thickness, we observed the same high VLSAW on both the ±Z surfaces. We could estimate the resistivities of 1·104 ¿m for the specimen after removal of the 0.5-mm thick layer and 30 ¿m to 1·104 ¿m distributed for the removed layer. This approach will contribute to establish our resistivity evaluation method using the LSAW propagation characteristics.
机译:我们通过测量50 MHz至1.5 GHz频率下的纵波传播特性(速度和衰减)以及泄漏表面声波(LSAW)速度(V )来评估Z切ZnO单晶板样品的电阻率)通过线聚焦束/平面波(LFB / PW)超声材料表征(UMC)系统在225 MHz的样品表面上进行。与+ Z表面的V LSAW 相比,在最初制备的样品的-Z平面上观察到V LSAW 的轻微降低。相应的Z轴纵波传播特性表现出明显的速度色散和衰减的频率依赖性,这与相对较低的电阻率有关。对于通过删除-Z侧面约0.5mm厚度的标本,我们在两个ƒÂ±Z的表面上观察到了相同的高V LSAW 。我们可以去除0.5毫米厚的层和30微米的样品后,估计样品的1ƒ···10 4 ƒ·μm的电阻率。将m分配为1÷·10 4 âÂÃ为删除的层分布。这种方法将有助于建立使用LSAW传播特性的电阻率评估方法。

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