Design of Low-frequency Noise Measurement System for Electronic Devices Based on FPGA

摘要

A new system is presented for the accurate measurement of low-frequency noise. The system consists of low-frequency noise test circuit, FPGA module and noise analysis software. Noise signals were generated by noise test circuit. The measurements were performed in the time domain using A/D conservation which is on the Xilinx Sparnat-3E board. Then the results are Fast Fourier-transformed into the frequency domain by LabVIEW FPGA module. Measurement results are given in waveform in noise analysis software which also has store function. The experiment results show that this design is successful.