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HgCdTe APD- Focal Plane Array development at CEA Leti-Minatec

机译:HgCdTe APD-CEA Leti-Minatec的焦平面阵列开发

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We report the latest developments of MW HgCdTe electron initiated avalanche photo-diodes (e-APDs) focal plane arrays (FPAs) at CEA-LETI. The MW e-APD FPAs are developed in view of ultra-sensitive high dynamic range passive starring arrays, active 2D/3D and dual-mode passive-active imaging, which is why both the passive imaging performance and the gain characteristics of the APDs are of interest. A passive mode responsivity operability of 99.9% was measured in LPE and MBE e-APDs FPAs associated with an average NETD=12mK, demonstrating that dual mode passive-active imaging can be achieved with LETI e-APDs without degradation in the passive imaging performance. The gain and sensitivity performances were measured in test arrays and using a low voltage technology (3.3V) CTIA test pixel designed for 3D active imaging. The CTIA and test arrays measurements yielded comparable results in terms of bias gain dependence (M=100 at V_b=-7V), low excess noise factor ( = 1.2) and low equivalent input current (I_(4eq_in)<1pA). These results validated the low voltage CTIA approach for integrating the current from a HgCdTe e-APD under high bias. The test array measurements demonstrated a relative dispersion below 2% in both MBE and LPE e-APDs for gains higher than M>100, associated with an operability of 99%. The operability at I_(eq_in)<1pA at M=30 was 95%. A record low value of I_(eq_in)=1fA was estimated in the MBE e-APDs at M=100, indicating the potential for using the MW e-APDs for very low flux applications. The high potential of the MW e-APDS for active imaging was demonstrated by impulse response measurements which yielded a typical rise time lower than 100ps and diffusion limited fall time of 900ps to 5ns, depending on the pixel pitch. This potential was confirmed by the demonstration of a 2ns time of flight (TOF) resolution in the CTIA e-APD 3D pixel. The combined photon and dark current induced equivalent back ground noise at f/8 with a cold band pass filter at λ=T.55μm was 2 electrons rms for an integration time of 50ns.
机译:我们在CEA-LETI报告了MW HgCdTe电子引发的雪崩光电二极管(e-APDs)焦平面阵列(FPA)的最新进展。 MW e-APD FPA的开发是基于超灵敏的高动态范围无源星标阵列,有源2D / 3D和双模无源-有源成像,这就是为什么APD的无源成像性能和增益特性都得到满足的原因出于兴趣。在LPE和MBE e-APD FPA中,平均NETD = 12mK时,被动模式响应可操作性达到99.9%,这表明使用LETI e-APD可以实现双模式被动主动成像,而不会降低被动成像性能。在测试阵列中并使用专为3D主动成像设计的低压技术(3.3V)CTIA测试像素来测量增益和灵敏度性能。 CTIA和测试阵列的测量结果在偏置增益相关性(V_b = -7V时为M = 100),低过大噪声因子( = 1.2)和低等效输入电流(I_(4eq_in)<1pA)方面产生了可比的结果。 。这些结果验证了低压CTIA方法在高偏置下积分HgCdTe e-APD中的电流的方法。测试阵列的测量结果表明,MBE和LPE e-APD的相对色散均低于2%,增益高于M> 100,可操作性达到99%。 M = 30时I_(eq_in)<1pA时的可操作性为95%。在MBE e-APD中,M = 100时,I_(eq_in)= 1fA达到了创纪录的低值,表明在极低通量应用中使用MW e-APD的潜力。 MW e-APDS用于主动成像的高潜力已通过脉冲响应测量得到了证明,这取决于像素间距,产生的典型上升时间低于100ps,扩散限制的下降时间为900ps至5ns。通过在CTIA e-APD 3D像素中显示2ns的飞行时间(TOF)分辨率,证实了这种潜力。在λ=T.55μm的冷带通滤波器的作用下,光子和暗电流在f / 8处产生的等效背景噪声的总和为2电子rms,积分时间为50ns。

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