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Heavy ion irradiation test to gas electron multipliers

机译:气体电子倍增器的重离子辐射测试

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We have developed the gas electron multiplier (GEM) for applying to a cosmic X-ray polarimeter. For a space use of the GEM, we performed experiments of charged particles irradiation to the GEM as space environmental tests of cosmic rays. The GEM is irradiated with full-striped iron ions with energy of 500 MeV, as a result, we found that even if a particle deposits an energy of ~ 2 MeV in the detector, it has no direct effect on the GEM as long as the particle does not hit the GEM directly. In contrast, every time a particle collides with the GEM, it discharges with a probability of 0.4 - 40% which depending on the count rate, the applied voltage, and energy losses, but the mass of particles does not matter. The predicted count rate of discharges in the space is low enough, so it is negligible compared with a target object. We also found that an irradiation of charged particles for a certain period causes a destruction of the GEM, but the direct reason remains unclear.
机译:我们已经开发出适用于宇宙X射线旋光仪的气体电子倍增器(GEM)。对于GEM的空间使用,我们进行了带电粒子辐照GEM的实验,作为宇宙射线的空间环境测试。用能量为500 MeV / n的全条状铁离子辐照GEM,结果发现,即使粒子在检测器中沉积了约2 MeV的能量,只要它对GEM都没有直接影响因为粒子不会直接撞击GEM。相反,颗粒每次与GEM碰撞时,放电的概率为0.4-40%,这取决于计数率,施加的电压和能量损失,但颗粒的质量无关紧要。空间中预计的放电计数率足够低,因此与目标对象相比可以忽略不计。我们还发现,在一定时期内对带电粒子进行辐照会导致GEM破坏,但直接原因尚不清楚。

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