Study of Active Width-Reduced Line-Defect Photonic Crystal Waveguides for High Speed Applications

摘要

We study the electrical and optical characteristic of the width-reduced line-defect photonic crystal waveguides with lateral p-i-n structures on Silicon-on-Insulator substrates. A longitudinal-section-based electrical model is built to take the holes into consideration. Compared with the classical line-defect photonic crystal waveguides, the width reduced photonic crystal waveguide has much stronger capacity in optical confinement in plane, which can allow a narrower intrinsic layer that leads to a fast electric response.