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Research on controller of active probe of AFM for micro-manipulation

机译:用于微操作的原子力显微镜有源探头控制器的研究

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AFM(Atomic Force Microscopy)has been used in micro-manipulation system of MEMS(Micro-electro-mechanical System)and NEMS(Nano Engineered and Molecular Systems)structure assembly,and biology cell manipulation.Active probe of AFM is a kind of smart structure,and has unique characteristics than common probe.A typical system construction and key technologies of micro-manipulation system based on AFM have been analyzed in this paper.The design methods of controller have also been addressed.It has been presented that adopting active probe is a valid way of precise micro-manipulation.In order to decrease collision force of the tip,and to avoid destroying precise MEMS structure or biology body,the information of position and force should be considered simultaneously.On the basis of studying the existing methods of force/position hybrid control,we find that the method of periodic-output-feedback control based on infinite dimension system is a good way of inhabiting probe vibration and decreasing collision force of the tip.In this paper,the basic principle and key technology of this controller have been introduced,and the validity has been proved through micro-manipulation experiments.The results of this paper are beneficial to the design of common controller of automatic micro-manipulation system and other smart structures.
机译:AFM(原子力显微镜)已用于MEMS(微机电系统)的微操纵系统和NEMS(纳米工程与分子系统)结构组装以及生物细胞操纵。AFM的有源探针是一种智能本文分析了基于原子力显微镜的微操纵系统的典型系统结构和关键技术,并提出了控制器的设计方法。这是一种精确的微操作方法。为了减少尖端的碰撞力,避免破坏精确的MEMS结构或生物体,应同时考虑位置和力的信息。在研究现有方法的基础上在力/位置混合控制的基础上,我们发现基于无穷大系统的周期输出反馈控制方法是一种很好的抑制探头振动并减小振动的方法。本文介绍了该控制器的基本原理和关键技术,并通过微操纵实验证明了其有效性。微观操纵系统和其他智能结构。

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