首页> 外文会议>International conference on compound semiconductor MANufacturing TECHnology;CS MANTECH >High Yield Intra-Cavity Interconnection Fabrication Method And Characterization Methodologies
【24h】

High Yield Intra-Cavity Interconnection Fabrication Method And Characterization Methodologies

机译:高产量腔内互连的制造方法和表征方法

获取原文

摘要

Northrop Grumman Space Technology has demonstrated the capability to manufacture intra-cavity interconnections (ICICs), which consistently yield greater than 99%. These ICICs are an integral part of MMICs packaged at the wafer level using wafer bonding techniques. Efficient test structures were designed to evaluate these interconnects, allowing fast on-wafer assessment of interconnect yield in a production environment.
机译:北罗姆曼空间技术已经证明了制造腔内互连(ICIC)的能力,这一致的产量大于99%。这些ICICS是使用晶片键合技术在晶片级包装的MMIC的一部分。设计高效的测试结构以评估这些互连,允许快速的晶圆对生产环境中的互连产量进行快速的晶圆评估。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号