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Sampling Phased Array: A New Technique for Signal Processing and Ultrasonic Imaging

机译:采样相控阵:信号处理和超声成像的新技术

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Different signal processing and image reconstruction techniques are applied in ultrasonic non-destructive material evaluation. In recent years, rapid development in the fields of microelectronics and computer engineering lead to wide application of phased array systems. A new phased array technique, called "Sampling Phased Array" has been developed in Fraunhofer Institute for nondestructive testing. It realizes unique approach of measurement and processing of ultrasonic signals. The sampling phased array principle make use of the measurement of elementary waves generated by individual elements of sensor array to reconstruct the composite phased array signal for any arbitrary angle or focus depth. The use of special signal processing and image reconstruction algorithms, allows generating A-Scans of several angles and / or Sector-Scan, which can be implemented in real time. With parallel computing structures, this principle is used for automatic testing systems at very high inspection speed. A comparative study was done with Conventional Phased Array system and Sampling Phased Array technique. The study shows that the signal characteristics in both techniques are equal. In addition, the Sampling Phased Array technique is significantly beneficial in the many aspects like quality of information in specific cases, inspection speeds and adaptability to specific inspection tasks in comparison to conventional Phased Array. The electronics was developed as a development platform for high speed automated ultrasonic inspection systems for process integrated testing and also for testing of critical components. The development results, including relevant test methodology and electro-technical/electronic aspects are presented in the current work.
机译:在超声非破坏性材料评估中应用了不同的信号处理和图像重建技术。近年来,微电子学和计算机工程领域的快速发展导致相控阵系统的广泛应用。弗劳恩霍夫研究所已经开发出一种称为“采样相控阵”的新相控阵技术,用于无损检测。它实现了超声信号测量和处理的独特方法。采样相控阵原理利用传感器阵列各个元件产生的基波的测量结果,针对任意角度或聚焦深度重建复合相控阵信号。使用特殊的信号处理和图像重建算法,可以生成多个角度的A扫描和/或Sector-Scan,这些扫描可以实时实现。对于并行计算结构,此原理可用于具有很高检查速度的自动测试系统。使用常规相控阵系统和采样相控阵技术进行了比较研究。研究表明,两种技术的信号特性均相同。此外,与传统相控阵相比,采样相控阵技术在许多方面都具有显着优势,例如特定情况下的信息质量,检查速度以及对特定检查任务的适应性。该电子设备被开发为用于过程集成测试以及关键组件测试的高速自动化超声检查系统的开发平台。当前工作中介绍了开发结果,包括相关的测试方法和电工/电子方面。

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