首页> 外文会议>Fall Technical Conference of the Association of Industrial Metallizers, Coaters and Laminators 2007 and 21st International Vacuum Web Coating Conference >Procedures and Pitfalls in Measuring Surface Resistance in Deposited Films at Very Low and Very High Values
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Procedures and Pitfalls in Measuring Surface Resistance in Deposited Films at Very Low and Very High Values

机译:在非常低和非常高的值下测量沉积膜表面电阻的程序和陷阱

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1. There are lots of ways to get misleading results. 2. Study the literature. 3. Some of the instrument manufacturers publish excellent applications manuals. 3.1 http://www.keithley.com/wb/201 Keithley's Low Level Measurements Handbook. 4. If you use 4-pt. linear arrays, read Valdes. 4.1 Valdes, L G., Proc. I.R.E., 42, pp. 420-427 (February 1954). 5. Have fun, but be careful how much voltage the instruments might use to produce the currents they want to see. 5.1 This applies only to high resistance measurements.
机译:1.有很多方法可以获得误导结果。 2.研究文献。 3.一些仪器制造商发布了优秀的应用手册。 3.1 http://www.keithley.com/wb/201 keithley的低级测量手册。 4.如果你使用4-pt。线性阵列,读valdes。 4.1 Valdes,L G.,Proc。 I.R.E.,42,PP。420-427(1954年2月)。 5.玩得开心,但要小心仪器可以使用多少电压来产生他们想要看到的电流。 5.1这仅适用于高电阻测量。

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