This paper introduces the principles and execution of a new method of measuring for low-level retardation distribution, which requires only three phase-shifting data. To verify this method experimentally, a precise crystal wave plate having nominal retardation ± tolerance of 79.1±3.5 was used as a specimen. The experimental results for the proposed method are quantitatively compared with the retardation of the specimen and the usefulness of the principle is presented.
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