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A Quick Experimental Technique In Estimating The Cumulative Plasma Charging Current with MOSFET and Determining The Reliability of The Protection Diode In The Plasma Ambient

机译：用MOSFET估算累积等离子体充电电流并确定等离子体环境中保护二极管可靠性的快速实验技术

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《Next Generation Internet Networks, 2005 》|2005年|p.27-29|共3页
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Zheng S.; Donggun Park; Nguyen Bui; Chenming Hu; Yue J.;
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中图分类自动化技术、计算机技术 ;
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1. Reliability analysis of charge plasma based double material gate oxide (DMGO) SiGe-on-insulator (SGOI) MOSFET [J] . K.P. Pradhan, P.K. Sahu, D. Singh, Superlattices and microstructures . 2015 ,第SEPa期

机译：电荷等离子体双材料栅氧化层（SiGO-on-绝缘层）MOSFET的可靠性分析
2. Investigation of the reliability of Unibond and SIMOX N-MOSFETs using charge pumping and noise techniques [J] . Shing-Hwa Renn, Jomaah J. Electronics Letters . 1998 ,第18期

机译：使用电荷泵和噪声技术研究Unibond和SIMOX N-MOSFET的可靠性
3. Plasma-based ambient mass spectrometry techniques: The current status and future prospective [J] . Ding Xuelu, Duan Yixiang Mass Spectrometry Reviews . 2015 ,第4期

机译：基于等离子体的环境质谱技术：现状和未来展望
4. A Quick Experimental Technique In Estimating The Cumulative Plasma Charging Current with MOSFET and Determining The Reliability of The Protection Diode In The Plasma Ambient [C] . Zheng, S., Donggun Park . 2001

机译：用MOSFET估算累积等离子体充电电流并确定等离子体环境中保护二极管可靠性的快速实验技术
5. Imaging and Probe Techniques for Wave Dispersion Estimates in Magnetized Plasmas. [D] . Light, A. D. 2014

机译：磁化等离子体中波色散估计的成像和探针技术。
6. Contribution of Fluorescence Techniques in Determining the Efficiency of the Non-thermal Plasma Treatment [O] . Gaëlle Carré, Emilie Charpentier, Sandra Audonnet, -1

机译：荧光技术在确定非热等离子体处理效率方面的贡献
7. Development of an ultrafast on-the-fly I DLIN technique to study NBTI in plasma and thermal oxynitride p-MOSFETs [O] . MAHETA VD, NARESH KUMAR E, PURAWAT S, 2008

机译：开发超快I DLIN技术研究等离子体和热氧氮化物p-MOSFET中的NBTI
8. Diagnostic Techniques for Magnetically Confined High-Temperature Plasmas. II. Magnetic and Electric Measurements, Charge-Exchange Diagnostics, Particle-Beam Diagnostics, and Fusion-Product Measurements [R] . Goldston, R. J. 1982

机译：磁约束高温等离子体的诊断技术。 II。磁电测量，电荷交换诊断，粒子束诊断和融合产品测量

A Quick Experimental Technique In Estimating The Cumulative Plasma Charging Current with MOSFET and Determining The Reliability of The Protection Diode In The Plasma Ambient

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