首页> 外文会议>Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE >Application of Trend Analysis Methodologies on Built-in-Test (BIT) (and non-BIT) Systems in a Operational U.S. Navy Fighter/Attack Squadron
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Application of Trend Analysis Methodologies on Built-in-Test (BIT) (and non-BIT) Systems in a Operational U.S. Navy Fighter/Attack Squadron

机译:趋势分析方法在美国海军作战/攻击中队的内置测试(BIT)(和非BIT)系统上的应用

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This paper will outline the process and ‘real-world'' experience of applying trending techniques to supporting a highly complicated system within a high pressure environment with an extremely low tolerance for errors by improving the corrective and preventative maintenance cycles. The paper will also discuss some of the key benefits realized and challenges encountered in implementing this.
机译:本文将概述采用趋势技术来支持高压环境中的高度复杂系统的过程以及“现实世界”的经验,该系统通过改善纠正性和预防性维护周期,对错误的容忍度极低。本文还将讨论在实现此目标时实现的一些关键优势和遇到的挑战。

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