【24h】

Contact material and arc current affect on post-current zero contact surface temperature

机译:触头材料和电弧电流对后电流零触头表面温度的影响

获取原文

摘要

Optical radiation measurements of contact surfaces were made after current-zero of a high-current (<10 kA/sub p/) arc, to determine how much the contact surface temperature at and after current zero was affected by a change in contact material and arc current. Contact surface temperature was measured for different types of "typical" contact materials (AgW and AgC) commonly used in molded case circuit breakers (MCCB's). The average temperature at the contact surface was measured by using photodiodes in conjunction with a narrow band filters and a long-range microscope. A 250 Amp rated MCCB was modified, with renewable chamber walls and contacts, and used as a test bed to insure that these results can be directly applied to MCCB's in the 125 to 250 Amp range. Uniform and repeatable arcing conditions were maintained by using an electronically timed capacitor bank source, timed contact part, and a well-maintained arc chamber. Along with other important engineering properties of the contacts (arc erosion, temperature rise), this data can be useful for selecting contacts for circuit breaker applications.
机译:在大电流(<10 kA / sub p /)的电流为零后进行接触表面的光辐射测量,以确定在电流零时及之后零接触表面温度受接触材料变化的影响,以及电弧电流。测量了用于塑壳断路器(MCCB's)的不同类型的“典型”接触材料(AgW和AgC)的接触表面温度。接触表面的平均温度是通过使用光电二极管,窄带滤光片和长距离显微镜来测量的。修改了250 Amp额定值的MCCB,其腔室壁和触点可再生,并用作测试床,以确保将这些结果直接应用于125至250 Amp范围的MCCB。通过使用电子定时电容器组电源,定时接触部件和维护良好的电弧室,可以保持均匀且可重复的电弧放电条件。连同触点的其他重要工程特性(电弧腐蚀,温度升高)一起,该数据对于选择断路器应用的触点可能很有用。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号