Loopback or not? (loopback testing)

摘要

For the verification of high-speed serial I/O devices, a new architecture, which is different from the conventional ET sampling method, must be developed to measure ultra-wideband jitter in the bit stream transmitted from a multi-Gb/s physical layer IC. For testing in a high-volume test environment, our challenge is to find a way to test the jitter tolerance of Rx that is more effective than the conventional loopback test.