Can supply current monitoring be applied to the testing of analogueas well as digital portions of mixed ASICs?

摘要

Investigations are made into the suitability of supply currentmonitoring as a technique for the testing of analogue circuit modules.Iddq monitoring is already recognised in the digital field. Thepossibility of a unified testing approach for mixed ASICs is raised. Thepotential effectiveness of the method is investigated. Simulationresults are reported to illustrate typical supply current levels fornominal and defective circuits. Analogue fault detection by thistechnique is compared with detection by observation of the circuit'soutput