Test resource partitioning based on efficient response compaction for test time and tester channels reduction

摘要

This paper presents a test resource partitioning technique based on an efficient single-output response compaction design called quotient compactor (q-Compactor). Some design theorems of quotient compactor are presented to achieve full diagnostics ability, minimize error cancellation and handle the X bits in the outputs of the CUT The quotient compactor can also be moved to the load-board to reduce the number of ATE channels required. Our experimental results on the ISCA S89 benchmark circuits and an MPEG 2 decoder SOC show that the proposed compaction scheme is very efficient.