Quantitative Stress-Induced Birefringence Measurements of Large Optics by a Prototype Imaging Polarimeter

摘要

A prototype imaging polarimeter is developed that measured retardance due to stress induced birefringence of large optics. A synchronous detection scheme is utilized in the measurement of retardance. The instrument has a variable sensitivity due to fast axis angle of the sample being tested which is remedied by making two measurements with a linear input polarization state that rotated 45 degrees. This polarimetric technique is inherently less sensitive to environmental noise than interferometric techniques to measure stress induced birefringence and is able to measure residual retardance of assembled large optics within the tolerance required by the National Ignition Facility project.