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Microwave active cold/warm noise source for calibration of radiometer sensors

机译:用于校准辐射计传感器的微波活性冷/暖噪声源

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For most radiometers, periodic calibration is essential to ensure sensor measurement accuracy. This paper describes the application of a unique active microwave circuit that simulates known radiated thermal temperatures over a stepped range of less than 105 K to over 300 K. The device, when connected or switched to the input of a receiver, can be incrementally stepped via a bias voltage from the coldest to the warmest temperature. It offers the potential to replace more complex and expensive external and internal calibration techniques. In addition to calibration, the device also serves to test the receiver linearity and measure receiver noise figure. The paper will identify significant advances in the area of modeling, design, development, and test of the stepped 'cold/warm' noise source. Several prototype FET circuits, using 150 and 300 micrometer InP devices, have been built and demonstrated at K-band frequencies of 18 - 22 GHz. Work is in progress to build and test the next device at 37 GHz. Tests have been conducted at Raytheon Systems, the University of South Florida (USF), and the National Institute of Science and Technology (NIST). The results illustrate good agreement between simulation and measurements. Block diagrams are included to show the method of calibrating radiometers, testing receiver linearity, and measuring receiver noise figure.
机译:对于大多数辐射计,定期校准对于确保传感器测量精度至关重要。本文介绍了唯一有源微波电路的应用,该电路在阶梯范围内模拟了小于105k至超过300k的阶梯范围。当连接或切换到接收器的输入时,可以通过从最寒冷到最温度的偏置电压。它提供了更换更复杂和昂贵的外部和内部校准技术的可能性。除了校准之外,该设备还用于测试接收器线性度和测量接收器噪声系数。本文将确定阶梯式“冷/暖”噪声源的建模,设计,开发和测试领域的显着进展。使用150和300微米INP器件的多个原型FET电路已经在18 - 22 GHz的K波段频率下构建和演示。工作正在进行中,以便在37 GHz中构建和测试下一个设备。在南佛罗里达大学(USF)和国家科学与技术研究所(NIST)进行了测试。结果说明了模拟和测量之间的良好一致性。包括框图以显示校准辐射仪,测试接收器线性度和测量接收器噪声系数的方法。

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