Dynamic theory of electrothermal degradation and NDT of defects in metal-dielectric-metal (MDM) structures

摘要

On base of the solid state physics and theory of nonlinear oscillations interpretations a development of the thermofluctuation fatigue of mechanics theory is formulated. It is shown that electrical damage has resonance nature. An influence of the electron processes on the first time pre- breakdown stage with mainly microdefects formation is considered. The proposed theory contains consideration of polarization of the local domains the 'cross-pieces' between neighboring micropores, which formed elementary electrical dipoles. Strong external constant electrical field leads to negative differential resistance of the local dielectric domains with N- or S-type current-voltage-characteristic (CVC) parts and as a result to current oscillations and electromagnetic wave radiation from MDM structure (as in Gunn's diode). On base of A. Puankare's limit cycles nonlinear oscillations theory it is shown that defects formation leads to self-exciting current oscillations and microwave radiation. This information can be used in thermosense NDT and, that is principal, for elimination of the defects, which arose under fabrication of electronic devices.