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Laser interferometer with a sharply focused beam as a tool for optical tomography

机译:具有聚焦光束的激光干涉仪,作为光学层析成像的工具

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Abstract: On the base of spatial-temporal analogy in properties of the optical fields the equivalence of temporal and spatial photodetector averaging of light interference field is shown. In the low-coherence interferometry the interferential signal is vanished when optical path difference becomes more than light coherence length l$-c$/ approximately equals $lambda$+2$//$Delta$lambda@. This value determines the accuracy of the testing of the reflecting layer location. The analogous vanishing of the interferential signal can be realized by a spatial averaging of the interference field in the case of the sufficiently wide receiving photodetector aperture. For such averaging Michelson interferometer with a laser beam focussed on the object surface can be used. In this case interferential signal is vanished when the surface displacement is more than a focussed beam parameter $delta@($Delta@z) equals $lambda@/(NA)$+2$/, where NA is a numerical aperture of the objective. With NA approximately equals 1 only a few oscillations of interferential signal is observed. It is corresponding to advanced achievements of the low-coherence interferometry. The experimental results show a high testing accuracy of the position of smooth and rough surfaces, the thickness of transparent coating attached to the rough surface and multilayered scattering objects. Thus, interferometers with a sharply focussed probing beam can be consider as a good alternative for the low-coherence interferometry and can be used in coherent optical tomography. !18
机译:摘要:在光场特性的时空类比的基础上,显示了光干涉场的时空光电探测器平均的等效性。在低相干干涉测量法中,当光程差变得大于光相干长度l $ -c $ /大约等于$ lambda $ + 2 $ // $ Delta $ lambda @时,干涉信号消失。该值确定反射层位置的测试精度。在接收光检测器孔径足够大的情况下,可以通过对干扰场进行空间平均来实现干扰信号的类似消失。对于这种平均的迈克尔逊干涉仪,可以使用聚焦在物体表面的激光束。在这种情况下,当表面位移大于聚焦光束参数$ delta @($ Delta @ z)等于$ lambda @ /(NA)$ + 2 $ /时,干涉信号消失,其中NA是物镜的数值孔径。当NA大约等于1时,仅观察到少量干扰信号振荡。它与低相干干涉测量技术的先进成就相对应。实验结果表明,对光滑和粗糙表面的位置,附着在粗糙表面上的透明涂层的厚度以及多层散射物体的测试精度很高。因此,具有明显聚焦的探测光束的干涉仪可以被认为是低相干干涉仪的一个很好的选择,并且可以用于相干光学层析成像中。 !18

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