Bridging fault detection in FPGA interconnects using IDDQ

摘要

This paper presents a vector generation approach for testing interconnects in configurable (SRAM-based) Field Programmable Gate Arrays (FPGAs). The proposed approach detects bridging faults and is based on quiescent current (IDDQ monitoring. Compared with previous voltage-based methods, IDDQ testing has the advantage of utilizing a small number of programming phases for configuring the FPGA during the test process with negligible observability requirements, even under multiple faults. Algorithms for test generation which exploit the homogeneous nature of the FPGA array, are described. An example using the XC4000 is described in detail. For testing the XC4000 series interconnect, a total of 20 phases and 11 vectors are required: 11 phases for S (switch) block testing, and 9 phases for C (connection) block testing.