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Cooled-CCD and amorphous silicon-based neutron imaging systems for low-fluence neutron sources

机译:低通量中子源的冷却CCD和基于非晶硅的中子成像系统

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Abstract: We have developed a neutron detection system for accelerator based neutron radiography and tomography based on a combination of scintillation screen and large aperture optics combined with a cooled CCD camera. The system is capable of detecting single neutron events and can therefore be considered as a possible detector for neutron scattering as well as conventional imaging. The system has a resolution of 0.1 mm or 1242 by 1152 pixels. The limit of image size is set by the light output of the scintillator, the light collection of the optical system, the size of the CCD and the desired signal to noise ratio. The lower limit on neutron flux is determined by the dark current of the chip. Equations for these limits have been derived and can be used to predict and optimize performance. The scintillation light output per incident neutron is large enough to permit the use of lens coupled systems with their increased flexibility and ease of implementation. The system can approach a quantum limited noise level, depending on the particular geometry used. For our current system, based on the use of NE 426 scintillator,$+3$/ a 1242 by 1152 pixel EEV CCD operating at $MIN@50C, and using a 100 mm focal length, F/0.9 lens, the maximum size for the imaging screen is 0.5 m, and the lower limit for flux is 1 n/pixel/s based on this size screen and a typical dark current of 10 e/pixel/s. We are now investigating a new type of imaging technology based on large amorphous silicon sensor arrays being developed by Xerox and others. A typical device is 200 by 250 mm with a pixel size of 127 $mu@m and the entire array with all electronics is in a 400 mm by 37 mm package. Major advantages of this device are the high light coupling between scintillator screen and the sensor as well as the more compact nature of such an array, since no lens systems is required and, potentially, a much lower cost. Currently, the noise performance is worse than that of CCDs, largely due to the current electronic readout but should be adequate to produce quantum limited images if electronics can be improved. !12
机译:摘要:我们已经开发了一种基于闪烁屏和大口径光学器件与冷却CCD相机相结合的,用于基于加速器的中子射线照相和断层扫描的中子检测系统。该系统能够检测单个中子事件,因此可以被视为中子散射以及常规成像的可能检测器。系统的分辨率为0.1毫米或1242 x 1152像素。图像大小的限制由闪烁器的光输出,光学系统的光收集,CCD的大小以及所需的信噪比设置。中子通量的下限由芯片的暗电流决定。这些限制的方程式已经导出,可以用于预测和优化性能。每个入射中子的闪烁光输出足够大,以允许使用透镜耦合系统,因为它们具有更高的灵活性和易于实施的特性。该系统可以接近量子限制的噪声水平,这取决于所使用的特定几何形状。对于我们当前的系统,基于使用NE 426闪烁体,$ + 3 $ /一台1242 x 1152像素EEV CCD,工作在$ MIN @ 50C下,并使用100 mm焦距F / 0.9镜头,最大尺寸为成像屏幕为0.5 m,基于该尺寸的屏幕和典型的暗电流10 e / pixel / s,通量的下限为1 n / pixel / s。我们现在正在研究一种新型的成像技术,该技术基于施乐等公司正在开发的大型非晶硅传感器阵列。典型的器件为200 x 250 mm,像素尺寸为127μm@ m,整个阵列以及所有电子器件都采用400 mm x 37 mm的封装。该装置的主要优点是闪烁体屏幕和传感器之间的高光耦合以及这种阵列的更紧凑的性质,因为不需要透镜系统,并且可能会大大降低成本。当前,噪声性能比CCD差,这主要是由于当前的电子读数,但如果可以改善电子性能,则应足以产生量子受限的图像。 !12

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