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Field function evaluation techniques for electron lenses and deflectors

机译:电子透镜和偏转器的场函数评估技术

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Abstract: This paper describes numerical techniques for computing axial field functions in focusing and deflection systems for charged particle beams. For systems with a straight optical axis, the computation of axial field functions using first- order and second-order finite element methods are compared, for electron lenses, deflectors and stigmators. The results show that the second-order finite element method gives greater accuracy for the high-order derivatives of the axial functions, which are needed for computing the fifth-order aberrations. The extension of these methods to computing perturbation fields caused by mechanical defects in the optical elements is also described. Methods for computing multipole field functions using a fully 3D field analysis are then described. These 3D methods are of quite general applicability to systems with fully 3D electrode and polepiece structures, and either straight or curved axes. Illustrative examples are shown of a multipole aberration corrector with a straight axis and a bending magnet with a curved optical axis.!17
机译:摘要:本文介绍了用于计算带电粒子束聚焦和偏转系统中轴向场函数的数值技术。对于具有直光轴的系统,比较了使用一阶和二阶有限元方法对电子透镜,偏转器和柱头的轴向场函数的计算。结果表明,二阶有限元方法对于计算五阶像差所需要的轴函数的高阶导数提供了更高的精度。还描述了这些方法在计算由光学元件中的机械缺陷引起的扰动场方面的扩展。然后介绍了使用完全3D场分析计算多极场函数的方法。这些3D方法非常适用于具有完全3D电极和极靴结构以及直轴或弯曲轴的系统。示出了具有直轴的多极像差校正器和具有弯曲光轴的弯曲磁体的说明性示例。17

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