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Stark effect: a novel method of characterization of low-dimensional heterostructure semiconductor lasers

机译:斯塔克效应:一种表征低维异质结构半导体激光器的新颖方法

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Abstract: Application of electric field to heterostructure p-n junctions beyond the threshold produces lasing. On further increase of the electric field the peak of the intensity shifts towards red. The line width also increases. In this article it is shown that this shift as well as the change in the line width can be effectively utilized to distinguish the 3D to 0D structures. The shift in the bulk structure exhibits F$+2/3$/ power law, where 'F' is the electric field, while 2D, 1D, and 0D samples give rise to a quadratic dependence as in single atoms. In addition elegant modifications in micro-fabricational techniques are suggested as to realize more efficient structures with ease. !40
机译:摘要:超过阈值的异质结构p-n结施加电场会产生激光。随着电场的进一步增加,强度的峰值移向红色。线宽也会增加。在本文中显示,可以有效利用此偏移以及线宽的变化来区分3D到0D结构。整体结构的位移表现出F $ + 2/3 $ /幂定律,其中“ F”是电场,而2D,1D和0D样本则像单个原子一样产生二次依赖性。另外,建议对微制造技术进行优雅的修改,以轻松实现更有效的结构。 !40

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