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Separation of bulk and interface contributions by optical second harmonic electroreflectance spectroscopy of a Si0001 metal-oxide-semiconductor structure

机译：Si 0001金属氧化物半导体结构的光学二次谐波电反射光谱法分离体积和界面贡献

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《Quantum Electronics and Laser Science Conference, 1996. QELS '96., Summaries of Papers Presented at the》|2001年|P.133-134|共2页
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Dadap; J.I.; Hu; X.F.;
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中图分类无线电电子学、电信技术;
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1. Relative bulk and interface contributions to optical second-harmonic generation in silicon [J] . H. J. Peng, E. J. Adles, J.-F. T. Wang, Physical review. B, Condensed Matter And Materials Physics . 2005,第20期

机译：硅中光学二次谐波产生的相对体积和界面贡献
2. Bulk and interface contributions to the optical second-harmonic response of native-oxide-covered vicinal Si(111) [J] . McGlip JF, Carroll L Physica status solidi, B. Basic research . 2005,第15期

机译：体积和界面对天然氧化物覆盖的邻域Si（111）的光学二次谐波响应的贡献
3. Interface electronic transition observed by optical second-harmonic spectroscopy in beta-GaN/GaAs(001) heterostructures [J] . Lupke G., Meyer C., Kurz H., Physical Review, B. Condensed Matter . 1998,第7期

机译：通过光学二次谐波光谱法在β-GaN/ GaAs（001）异质结构中观察到界面电子跃迁
4. Separation of bulk and interface contributions by optical second harmonic electroreflectance spectroscopy of a Si(001) metal-oxide-semiconductor structure [C] . Dadap J.I., Hu X.F., Anderson M.H., Quantum Electronics and Laser Science Conference, 1996. QELS '96., Summaries of Papers Presented at the . 1996

机译：Si（001）金属氧化物半导体结构的光学二次谐波电反射光谱法分离体积和界面贡献
5. Studies of liquid/solid interfaces and of bulk liquids using second harmonic generation and THz spectroscopy. [D] . Yang, Shuo-Che. 2000

机译：使用二次谐波和THz光谱研究液体/固体界面以及大块液体。
6. A comparative analysis of surface and bulk contributions to second-harmonic generation in centrosymmetric nanoparticles [O] . Daniel Timbrell, Jian Wei You, Yuri S. Kivshar, -1

机译：对中心对称纳米粒子中次谐波产生的表面和体积贡献的比较分析
7. Separation of bulk and interface contributions to electroforming and resistive switching behavior of epitaxial Fe-doped SrTiO3 [O] . Menke, Tobias, Meuffels, Paul, Dittmann, Regina, 2009

机译：主体和界面的分离对外延掺铁SrTiO3的电铸和电阻转换行为的影响
8. Electroreflectance Spectroscopy as a Probe of the Electronic Structure at the Metal-Electronic Interface [R] . Ho, K. M., Liu, S. H. 1984

机译：电反射光谱作为金属电子界面电子结构的探讨

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