Linear optical constants of ultrathin copperphthalocyanine films from transmittance and reflectance data: error function minimization when the film thickness is below 20 nm

摘要

Abstract: Thin copperphthalocyanine layers have been deposited onquartz glass substrates and investigated by means oftransmission and reflection spectroscopy. The filmthickness ranged between 20 nm and the subnanometerregion. The determination of the optical constantsallowed the estimation of the oscillator strengths forthe relevant molecular transitions. A thicknessdependence of the Q-band absorption maximum positioncould be established for layers with a thickness below5 nm. The contributions of several physical mechanismsto such lineshifts are discussed. !10