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Phase problem and the determination of sample profiles in neutron-specular reflection

机译:相位问题及中子镜面反射中样品谱的测定

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The role of the reflection phase in the determination of the scattering-length density profile in neutron specular reflection is emphasized. Various schemes for obtaining information on this phase as input to the solution of the inverse scattering problem are discussed. The possible effects of the finite thickness of the substrate on the measurements are considered.
机译:重点强调了反射阶段在中子镜面反射中散射长度密度分布的测定中的作用。讨论了用于获得该阶段的信息作为输入到逆散射问题的输入的各种方案。考虑了基板的有限厚度对测量的可能影响。

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