首页> 外文会议>Instrumentation and Measurement Technology Conference, 1991. IMTC-91. Conference Record., 8th IEEE >Measuring the temperature dependence of resistivity of high purity copper using a solenoid coil (SRPM method)
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Measuring the temperature dependence of resistivity of high purity copper using a solenoid coil (SRPM method)

机译:使用电磁线圈(SRPM方法)测量高纯铜电阻率的温度依赖性

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The resistivity of high-purity copper was measured by a method that estimates resistivity by using the difference in the impedance of a circular multilayer solenoid coil with a cylindrical copper core and an identical coil without a copper core (SRPM method). It was confirmed that an exact measurement of the resistivity of 10/sup -12/ Omega -m can be made. The residual resistivity ratio (RRR) of high-purity copper measured at 100 Hz correlates well with the values measured by the DC four-probe method. The existence of frequency dependence was discovered at very low resistivity for high-purity copper. As the measuring frequency is raised, the skin depth seems to affect the surface resistivity due to the oxide coating and dirt on the surface of the samples.
机译:通过使用具有圆柱形铜芯的圆形多层螺线管线圈和没有铜芯的相同线圈的阻抗之差来估计电阻率的方法测量高纯度铜的电阻率(SRPM方法)。已证实可以精确测量电阻率为10 / sup -12 / Omega -m。在100 Hz下测得的高纯度铜的残留电阻率(RRR)与通过直流四探针法测得的值很好地相关。对于高纯度铜,在非常低的电阻率下发现了频率相关性的存在。随着测量频率的提高,趋肤深度似乎会由于样品表面的氧化物涂层和污垢而影响表面电阻率。

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