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AlInAs/GaInAs SAGM-APD

机译:AlInAs / GaInAs SAGM-APD

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摘要

The fabrication and performance of a graded avalanche photodiode structure with a separate GaInAs photo-absorption layer and AlInAs avalanche region to achieve a pure electron injection are discussed. The quality of AlInAs as the avalanche region has been evaluated by measuring responsivity, response time, and excess noise factor. The 3 dB bandwidth and the excess noise factor correspond to beta / alpha approximately 0.3 in pure AlInAs, decreasing to about 0.1 for an AlInAs/GaInAs MQW structure.
机译:讨论了具有单独的GaInAs光吸收层和AlInAs雪崩区以实现纯电子注入的渐变雪崩光电二极管结构的制造和性能。通过测量响应度,响应时间和过量噪声因子,可以评估AlInAs作为雪崩区域的质量。 3 dB带宽和多余的噪声因数对应于纯AlInAs中的beta / alpha约为0.3,对于AlInAs / GaInAs MQW结构则降至约0.1。

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