首页> 外文会议>Instrumentation and Measurement Technology Conference, 1990. IMTC-90. Conference Record., 7th IEEE >A study on the metal-flanged open-ended coaxial line terminating in a conductor-backed dielectric layer
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A study on the metal-flanged open-ended coaxial line terminating in a conductor-backed dielectric layer

机译:金属法兰的开放式同轴线终止于背衬导体的介电层的研究

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A spectral domain approach is used to analyze aperture fields and aperture admittance of an open-ended coaxial line terminated by a conductor-backed dielectric layer. The aperture admittance and capacitance at various frequencies and thicknesses are calculated for various dielectrics. It is shown that, for d
机译:频谱域方法用于分析由导体支持的介电层终止的开放式同轴线的孔径场和孔径导纳。针对各种电介质,计算了在各种频率和厚度下的孔径导纳和电容。结果表明,对于d <或= 2b,结果非常接近于无限厚的介电介质。预期结果将有助于开发合适的程序来测量小厚度样品的电性能。

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