首页> 外文会议>Electrical Insulation, 1990., Conference Record of the 1990 IEEE International Symposium on >A surface resistivity probe for assessing solid insulators in GIS (gas insulated switchgear)
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A surface resistivity probe for assessing solid insulators in GIS (gas insulated switchgear)

机译:表面电阻率探头,用于评估GIS(气体绝缘开关设备)中的固体绝缘体

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The changes in surface characteristics after a spacer has been exposed to a large amount of SF/sub 6/ decomposition products for a short period of time, which is similar to conditions during fault repair, are described. The design and construction of a prototype surface electrical resistivity probe which can be used to assess the reusability of contaminated solid insulators are also described. This special, conformal surface resistivity probe was designed to carry out the demanding measurements on contoured surfaces. These measurements must be carried out under typical field conditions, and specifics of the critical experimental parameters (voltage, geometry, humidity) must be recognized. The probes have been used successfully to assess the condition of suspect spacers exposed to a high concentration of by-products following a power fault.
机译:描述了垫片在短时间内暴露于大量SF / sub 6 /分解产物后表面特性的变化,这与故障修复期间的情况类似。还描述了原型表面电阻率探针的设计和构造,该探针可用于评估受污染的固体绝缘子的可重复使用性。这种特殊的共形表面电阻率探头设计用于在轮廓表面上执行苛刻的测量。这些测量必须在典型的现场条件下进行,并且必须识别关键实验参数(电压,几何形状,湿度)的细节。该探针已成功用于评估电源故障后暴露于高浓度副产物的可疑隔离物的状况。

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