An integrated analog test simulation environment

摘要

An integrated test simulation environment which links circuit simulation data and tester simulation is presented. This environment is critical to the computer-aided development of test packages for analog integrated circuits. A working example is presented. The overall benefit of the integrated simulation environment described is a shortening of the test development cycle. By allowing the test engineer to begin test package development earlier, the overall, IC design/test process shifts from a serial task to one with significant overlap.