首页> 外文会议>Industry Applications Society Annual Meeting, 1989., Conference Record of the 1989 IEEE >Non-contact surface charge density profiles measurement on top and bottom of a charged film
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Non-contact surface charge density profiles measurement on top and bottom of a charged film

机译:在带电薄膜的顶部和底部进行非接触表面电荷密度分布测量

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Equivalent surface charge density profiles on the top and bottom surfaces of corona-charged films were measured using a surface potential voltmeter with a horizontal resolution of about 2 mm and a laser displacement meter with a vertical resolution of 10 mu m. A personal computer controlled the sample position with a resolution of a few tens of microns. The resolution was determined by the digital X-Y stage and the distance of the backside ground electrode from the bottom of the charged film. Surface potential profiles at several positions between the ground electrode (back) and the sample film were recorded, and the equivalent surface charge density profiles on the top and the bottom of the film were calculated and plotted automatically. Some interesting electrostatic phenomena related to the charge behavior of the films are reported: for example, the back side surface charge was affected by the surface discharge even if no ground electrode was nearby.
机译:使用水平分辨率为约2 mm的表面电位伏特计和垂直分辨率为10μm的激光位移计,测量带电晕膜顶部和底部表面上的等效表面电荷密度分布。一台个人计算机以几十微米的分辨率控制样品的位置。分辨率由数字X-Y平台和背面接地电极到带电薄膜底部的距离确定。记录接地电极(背面)和样品膜之间几个位置的表面电势分布,并自动计算并绘制膜顶部和底部的等效表面电荷密度分布。报道了一些与薄膜的电荷行为有关的有趣的静电现象:例如,即使附近没有接地电极,背面的表面电荷也会受到表面放电的影响。

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