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Influence of Laser Radiation on Embedded Non Volatile Memories and its Application for Descrambling Verification

机译：激光辐射对嵌入式非易失性存储器的影响及其在解扰验证中的应用

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《International symposium for testing and failure analysis 》||354-358|共5页
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I. ?sterreicher; J. Skuras; A. Haase;
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3. Surface potential based analytical modeling of double gate MOSFET with si and au nano-dots embedded gate dielectric for non-volatile memory applications [J] . Sengupta A., Sarkar C.K. Journal of computational and theoretical nanoscience . 2013 ,第4期

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4. Influence of Laser Radiation on Embedded Non Volatile Memories and its Application for Descrambling Verification [C] . I. ?sterreicher, J. Skuras, A. Haase ISTFA 2011 . 2011

机译：激光辐射对嵌入式非易失性存储器的影响及其解扰验证的应用
5. Integration of non-volatile memory with volatile memory for embedded memory architectures and signal processing applications [D] . Choi, David Suho 2008

机译：非易失性存储器与易失性存储器的集成，用于嵌入式存储器体系结构和信号处理应用
6. Nanocrystal-Embedded-Insulator (NEI) Ferroelectric FETs for Negative Capacitance Device and Non-Volatile Memory Applications [O] . Yue Peng, Genquan Han, Wenwu Xiao, 2019

机译：用于负电容器件和非易失性存储器应用的纳米晶体嵌入式绝缘体（NEI）铁电FET
7. Nanocrystal-Embedded-Insulator (NEI) Ferroelectric FETs for Negative Capacitance Device and Non-Volatile Memory Applications [O] . Yue Peng, Genquan Han, Wenwu Xiao, 2019

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Influence of Laser Radiation on Embedded Non Volatile Memories and its Application for Descrambling Verification

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