in'/> Level-Crossing Detection based Low-Power Sigma-Delta ADC for Sensor Applications
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Level-Crossing Detection based Low-Power Sigma-Delta ADC for Sensor Applications

机译:用于传感器应用的基于电平交叉检测的低功耗Sigma-Delta ADC

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A Current Controlled Oscillator (ICO), integrates its information-bearing current-input-signal iin using a capacitor, C. The voltage VC across C, namely the integral, is reset or folded when it reaches a level VREF. If iin (dq/dt) is constant, then VC is a saw-tooth waveform. Since the frequency of the oscillator is defined as the rate of change of phase, the phase wraps itself after every 2π radians or its corresponding voltage VREF. With this property we propose an open-loop continuous-time Sigma-Delta ADC combining level-crossing detection and folding techniques using an ICO. We also propose a technique to increase the effective resolution of the ADC by inserting additional voltage-levels for detection between 0 and VREF. The complete ADC is designed in TSMC 40nm CMOS technology. The simulation results show an ENOB of 12.2-bits consuming 1.5μW of power from a 1V supply corresponding to a Schreier-FOM of 167.2dB and a Walden-FOM of 157fJ per conversion cycle.
机译:电流控制振荡器(ICO)集成了其信息承载电流输入信号i in 使用电容器C。电压V C C上的积分(即积分)达到水平V时将重置或折叠 REF 。如果我 in (dq / dt)是常数,则V C 是锯齿形波形。由于将振荡器的频率定义为相位变化率,因此每2π弧度或其对应的电压V后,相位会自动回绕 REF 。利用这一特性,我们提出了一种结合了跨水平检测和使用ICO的折叠技术的开环连续时间Sigma-Delta ADC。我们还提出了一种通过在0至V之间插入额外的检测电压电平来提高ADC的有效分辨率的技术 REF 。完整的ADC采用台积电40nm CMOS技术设计。仿真结果表明,一个1V电源消耗的ENOB为12.2位,消耗1.5μW的功率,这相当于每个转换周期的Schreier-FOM为167.2dB,Walden-FOM为157fJ。

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