Mutation Operators for UML Class Diagrams

摘要

Mutation Testing is a well-established technique for assessing the quality of test cases by checking how well they detect faults injected into a software artefact (mutant). Using this technique, the most critical activity is the adequate design of mutation operators so that they reflect typical defects of the artefact under test. This paper presents the design of a set of mutation operators for Conceptual Schemas (CS) based on UML Class Diagrams (CD). In this paper, the operators are defined in accordance with an existing defects classification for UML CS and relevant elements identified from the UML-CD meta-model. The operators are subsequently used to generate first order mutants for a CS under test. Finally, in order to analyse the usefulness of the mutation operators, we measure some basic characteristics of mutation operators with three different CSs under test.