首页> 外文会议>Annual International Conference of the IEEE Engineering in Medicine and Biology Society >Evaluating Accuracy of Numerical Simulations in Predicting Heating of Wire Implants During MRI at 1.5 T
【24h】

Evaluating Accuracy of Numerical Simulations in Predicting Heating of Wire Implants During MRI at 1.5 T

机译:预测MRI在1.5 T时线植入物加热的数值模拟的准确性评估

获取原文

摘要

Patients with long conductive implants such as deep brain stimulation (DBS) leads are often denied access to magnetic resonance imaging (MRI) exams due to safety concerns associated with radiofrequency (RF) heating of implants. Experimental temperature measurements in tissue-mimicking gel phantoms under MRI RF exposure conditions are common practices to predict in-vivo heating in the tissue surrounding wire implants. Such experiments are both expensive—as they require access to MRI units—and time-consuming due to complex implant setups. Recently, full-wave numerical simulations, which include realistic MRI RF coil models and human phantoms, are suggested as an alternative to experiments. There is however, little literature available on the accuracy of such numerical models against direct thermal measurements. This study aimed to evaluate the agreement between simulations and measurements of temperature rise at the tips of wire implants exposed to RF exposure at 64 MHz (1.5 T) for different implant trajectories typically encountered in patients with DBS leads. Heating was assessed in seven patient-derived lead configurations using both simulations and RF heating measurements during imaging of an anthropomorphic head phantom with implanted wires. We found substantial variation in RF heating as a function of lead trajectory; there was a 9.5-fold and 9-fold increase in temperature rise from ID1 to ID7 during simulations and experimental measurements, respectively. There was a strong correlation (r2 = 0.74) between simulated and measured temperatures for different lead trajectories. The maximum difference between simulated and measured temperature was 0.26 °C with simulations overestimating the temperature rise.
机译:由于与植入物的射频(RF)加热相关的安全隐患,经常使用长导电植入物(例如深部脑刺激(DBS)引线)的患者被拒绝参加磁共振成像(MRI)检查。在MRI RF暴露条件下,模拟组织的凝胶体模中的实验温度测量是预测导线植入物周围组织体内发热的常用方法。这样的实验既昂贵(因为它们需要使用MRI单元),又由于复杂的植入物设置而费时。最近,建议使用全波数值模拟作为实验的替代方法,其中包括逼真的MRI RF线圈模型和人体模型。然而,关于这种数值模型相对于直接热测量的准确性的文献很少。这项研究旨在评估在DBS导线患者中通常遇到的不同植入物轨迹下,在64 MHz(1.5 T)的RF暴露下,导线植入物尖端的温度升高的仿真与测量值之间的一致性。在模拟人形头部幻影和植入导线的成像过程中,使用模拟和RF加热测量,评估了七个患者衍生导线配置中的加热情况。我们发现,随着引线轨迹的变化,射频加热的变化很大。在模拟和实验测量期间,从ID1到ID7的温升分别增加了9.5倍和9倍。有很强的相关性(r 2 = 0.74)在不同的铅轨迹的模拟温度和测量温度之间。模拟和测量温度之间的最大差异为0.26°C,其中模拟高估了温度升高。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号