On Lumped Port Calibration Techniques For Analysis of Planar Circuits With 3D FEM

摘要

A comparison of techniques for software calibration of lumped ports is presented in this paper. Three calibration techniques are investigated: double delay method, short-open calibration, and analytic evaluation of port parasitic inductance. All methods were applied to the same microstrip device and the efficiency of each calibration technique is discussed in the results section.