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Experimental Study on Polarization of X-Band Wave Absorber Configured by An Array of SRR with Thin Wire

机译:带有细线的SRR阵列配置的X波段波吸收器的极化实验研究

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This paper presents an experimental study on the polarization of X-band wave absorber which is configured by an array of split ring resonator (SRR) with thin wire. The structure of X-band wave absorber that consists of a doubly periodic array of unit cell is constructed in three layers, that is an SRR on the first layer, 0.2 mm air spacing on the second layer, and a thin wire on the third layer. A 1.6 mm thick FR4 Epoxy dielectric substrate is used to deploy an array of SRR and thin wire at the first and third layer, respectively. The dimension of each unit cell is 3.50 mm $imes$ 3.50 mm. The polarization is experimentally investigated by performing incident wave in some orientation angles, i.e. 0°, 45°, and 90°, upon the surface of X-band wave absorber. The results show that the minimum reflection coefficient occurred at the frequency of 8.26GHz are –24.15 dB, –23.29 dB, and –23.30 dB for the incident waves of 0°, 45°, and 90°, respectively.
机译:本文介绍了由带细线的裂环谐振器(SRR)阵列构成的X波段波吸收器极化的实验研究。 X波段波吸收器的结构由单元电池的双重周期性阵列组成,分为三层,即第一层上的SRR,第二层上0.2 mm的空气间距和第三层上的细线。使用1.6毫米厚的FR4环氧树脂电介质基板分别在第一层和第三层上部署SRR和细线阵列。每个晶胞的尺寸是3.50mm×3.50mm。通过在X波段吸波器的表面上以一些取向角(即0°,45°和90°)执行入射波来对偏振进行实验研究。结果表明,对于0°,45°和90°的入射波,在8.26GHz频率处出现的最小反射系数分别为–24.15 dB,–23.29 dB和–23.30 dB。

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