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ITHz one-sided directional slot antenna on a chip connected with InAs HEMT

机译:伊斯兰单面定向插槽天线与INAS HEMT连接的芯片上

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Terahertz (THz) range holds between infrared light and millimeter wave or microwave radiation. Moreover, THz waves is highly attenuated by the metal object or sensitive to an inter-molecular binding force. Therefore, imaging using THz range is attracted much attention for security, manufacturing, chemical imaging, and so on. In our research, the THz detector composed of Indium arsenide (InAs) high electron mobility transistor (HEMT) and one-sided directional slot antenna on a chip will be developed. In this paper, we focused on the antenna on a chip. The proposed antenna has three layers, namely, top antenna metal, dielectric substrate (BCB. benzocyclobutene) and bottom floating metal layer. There are a coplanar (CPW) feed lines and slots on the top antenna metal. By optimizing the size of the bottom floating metal layer, the radiation toward the back side is suppressed. The CPW feed line is connected the gate electrode on the InAs HEMT. In order to maximize the receiving THz signal form the antenna to InAs HEMT. antenna and gate input impedance is characterized by using the 3D electromagnetic simulator. It has been found that when the input impedance of the gate electrode changes from 10 ohms to 50 ohms, the voltage generated at the gate electrodes is tripled. The antenna was fabricated by the conventional photolithography process. The size of the radiation metal is 290 μm × 210 μm on the top metal with probe pads. The measured antenna gain is 5.57 dBi at 0.93 THz compared with the 5.96 dBi antenna gain at 1 THz from the simulation.
机译:太赫兹(Thz)范围持有红外光和毫米波或微波辐射。此外,THz波由金属物体高度衰减或对分子间结合力敏感。因此,使用THz系列的成像被吸引了安全性,制造,化学成像等的重视。在我们的研究,砷化铟构成的太赫兹检测器(的InAs)高电子迁移率晶体管(HEMT)和片面在芯片上定向缝隙天线将得到发展。在本文中,我们专注于芯片上的天线。所提出的天线具有三层,即顶部天线金属,介电基板(BCB。苯并环丁烯)和底部浮动金属层。顶部天线金属上有共面(CPW)馈线和槽。通过优化底部浮动金属层的尺寸,抑制了朝向背面的辐射。 CPW进料管线连接在INAS HEMT上的栅电极。为了最大化接收THz信号,将天线形成为INAS HEMT。天线和栅极输入阻抗的特征在于使用3D电磁模拟器。已经发现,当栅电极的输入阻抗从10欧姆变为50欧姆时,在栅电极处产生的电压是三倍的。通过传统的光刻工艺制造天线。顶部金属上的辐射金属的尺寸为290μm×210μm,探针垫在顶部金属上。测量的天线增益为5.57 dBi,与0.93 ZHz相比,从模拟中的5.96 dBi天线增益为5.96 dbi天线增益。

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