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Characterization of porosity and defects on composite materials using X-ray computed tomography and image processing

机译:使用X射线计算机断层扫描和图像处理表征复合材料上的孔隙率和缺陷

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This paper deals with the development of a measurement procedure to characterize anomalies, i.e. voids and defects, in four composite material (CM) samples. For this aim, four CM samples, each of them characterized by specific manufacturing techniques, have been analyzed. The first one (CM1) has Teflon defects, the second one (CM2) has undergone a low-degree manufacturing process and thus judged too porous at quality control, the third one (CM3) has passed the interlaminar shear strength (ILSS) test and so is expected to have a low-level of anomalies, unlike the fourth one (CM4), which has failed at ILSS test. An industrial X-ray computed tomography (CT) has been used to scan the CM samples and a specific image processing technique has been developed to measure the number and dimension of anomalies within them. The calculated amount of anomalies seems to be within the acceptable range identified in literature, always below 5%, showing the goodness of manufacturing process, and furthermore a threshold level of 0.09 mm has been statistically calculated to discriminate between voids and the other kinds of defects.
机译:本文涉及开发测量程序,以表征异常,即空隙和缺陷,在四种复合材料(CM)样品中。为此目的,已经分析了四厘米的样本,其特征在于特定的制造技术,其特征在于特定的制造技术。第一个(cm1)具有Teflon缺陷,第二个(CM2)经历了低度制造过程,因此在质量控制中判断过多,第三个(CM3)通过了层间剪切强度(ILSS)测试和所以预期具有低水平的异常,与第四个(CM4)不同,在ILSS测试失败。工业X射线计算机断层扫描(CT)已被用于扫描CM样本,并且已经开发了特定的图像处理技术来测量它们内的异常的数量和尺寸。计算的异常量似乎在文献中鉴定的可接受范围内,始终低于5%,显示了制造过程的良好,并且还在统计上计算了0.09mm的阈值水平,以区分空隙和其他类型的缺陷。

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