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Power cycling close to 50- Hz load, low temperature swings combined with an adjustable part of switching losses

机译:功率循环接近50 Hz负载,低温摆幅以及可调节的一部分开关损耗

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摘要

Power cycling tests with low temperature swings are interesting for a lot of users, because often many of them occur in the application. However, most manufacturers and lifetime models cannot make a statement about the range in which a temperature swing leads to permanent damage (plastic strain) or only to reversible deformation (elastic strain). In this work, a power cycling test with superimposed switching losses is intended to investigate the area where both mechanisms have an impact on the lifetime and which dependencies can be detected. Furthermore, a simulation will be performed to detect the influence of plastic and elastic strain in the bond interconnection regarding lifetime.
机译:低温摆幅的功率循环测试对于许多用户来说很有趣,因为在应用中经常会发生许多这种情况。但是,大多数制造商和使用寿命模型无法说明温度波动导致永久性损坏(塑性应变)或仅导致可逆变形(弹性应变)的范围。在这项工作中,具有开关损耗叠加的功率循环测试旨在研究两种机制都对寿命有影响并且可以检测到相关性的区域。此外,将执行仿真以检测键互连中的塑性和弹性应变对寿命的影响。

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