Rapid thickness and optoelectronic properties characterization of few-layer 2D materials based on hyperspectral microscopy

摘要

We present a technique to efficiently identify the thickness and properties of typical 2D materials. By taking microscopic images at a series wavelengths, we obtain reflectance, transmittance and absorption spectra in a single step. We demonstrate using the setup to unambiguously determine the thickness of MoS2 flakes and their excitonic properties.